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Confence : Resonant Elastic X-ray Scattering 2016
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Confence : Resonant Elastic X-ray Scattering 2016

REXS2016 conference on resonant elastic x-ray scattering is the 3rd in a row after the very successful events in Aussois 2011 and the subsequent conference in Oxford 2013.

13/06/2016 to 17/06/2016
When: 13/06/2016
Where: Deutsches Elektronen Synchrotron DESY
Notkestraße 85
Hamburg, DE -  22607

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The REXS conference series re-started again almost 20 years after the conference on Resonant Anomalous X-ray Scattering 1992 in Malente and the first conference on Resonant X-ray Scattering 1974 in Madrid. The conference is aimed at stimulating interaction and discussion of scientists working in the field of hard condensed matter research with synchrotron radiation and using spectroscopy and scattering methods, that base upon resonance effects occurring close to the x-ray absorption edges. Anomalous or resonant elastic x-ray scattering takes advantage of resonance enhancement of the scattered signal at the x-ray absorption edges and associated polarization effects. Experiments in this area range from conventional anomalous scattering and resonant magnetic diffraction to the investigation of exotic multipolar order or nuclear resonant diffraction. In addition, at REXS2016 we would like to emphasize the intrinsic ties and complementarity between scattering and spectroscopic methods (XMCD) for the investigation of properties of hard condensed matter materials and would like to bridge the gap between the two communities both in the soft and hard x-ray regime.

Contributions within the following areas are welcome:

  • Basic concepts/theory
  • Electronic correlations
  • Extreme conditions (pressure, electric/magnetic fields …)
  • Nanostructures
  • Chemistry
  • Time resolved diffraction /XFEL
  • Soft condensed matter/Life sciences
  • Ultra-fast scattering studies (XFEL)
  • Coherent scattering studies (at XFEL and storage rings)
  • Combined XMCD / REXS studies

Invited Speakers (confirmed)

P. Abbamonte, University of Illinois at UC
M. Altarelli, European XFEL
V. Dmitrienko, Institute of Crystallography, Moscow
M. Först, CFEL, MPI Structure & Dynamics
J.-W. Kim, APS/ANL
J. M. Perez-Mato, Universidad del Pais Vasco
V. Scagnoli, PSI
U. Staub, PSI
S. Wilkins, BNL
Y. Yamasaki, University of Tokyo


Important Deadlines
20. November 2015  Registration open
1. April 2016  Deadline Abstract submission
1. May 2016  Confirmation of approval of abstracts 

Early bird fee (payment until 15th May 2016): 320 EUR
Late registration fee: 450 EUR

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