SPIE Optical Metrology to present advances in measurement and inspection
04 April 2013
New research in optical measurement technologies enabling applications in industry, research modeling, inspection of nanostructures and artwork, and related topics will be presented at SPIE Optical Metrology 13-16 May. The programme includes talks in five technical areas as well as rewarding networking opportunities.
SPIE Optical Metrology, the field’s premier conference in Europe for
scientists, engineers, researchers and applications and product
developers, will be held 13-16 May at the International Conference
Centre Munich with the World of PHOTONICS Congress. Sponsored by SPIE Europe, Optical Metrology is part of the biennial
World of PHOTONICS Congress along with other conferences organized by
WLT (German Scientific Laser Society/Wissenschaftliche Gesellschaft
Lasertechnik), EOS (European Optical Society), OSA, IEEE Photonics
Society and EPS (European Physical Society). Read the complete article at: http://www.prweb.com/releases/2013/3/prweb10525400.htm
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