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School / Surface Science: Physical and chemical characterization of surfaces at different scales
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This school will address different aspects of surface analysis and appropriate analytical techniques in detail, from the most conventional (Raman spectroscopy, AFM/STM, IBA) to the most innovative requiring Synchrotron X-ray (X-ray spectroscopy, X-ray microscopy, X-ray diffraction/Scattering). The complementarity between laboratory and X-ray based techniques will be presented. A poster session will be organized during the school. The attendees are strongly advised to submit a short abstract.

16/11/2015 to 20/11/2015
When: 16/11/2015
09:00
Where: INSTN and SOLEIL Synchrotron
CEA Saclay
(close to Paris)
Gif sur Yvette, FR -  91191
France
Contact: Nadia Nowacki
+33(0)169083092

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Programme managers
Nihed Chaâbane, INSTN, CEA Saclay
Rachid Belkhou, Synchrotron SOLEIL

On-line application: http://www-instn.cea.fr
 
Contact & registration
Nadia Nowacki
Tel.: +33 1 69 08 30 92
Fax: +33 1 69 08 77 82

A poster session will be organized during the school. The attendees are strongly advised to submit a short abstract.
Please note that the deadline for abstract submission and registration is 20 October, 2015.
Further information (registration form, access map, hotels list...) is available on the web site.

Accommodation
Participants are invited to book their own accommodations. A list of
hotels in Paris and in the vicinity of INSTN will be posted on the school web site.

Location
INSTN Synchrotron SOLEIL
CEA Saclay Saint-Aubin
91191 Gif-sur-Yvette, France 91192 Gif-sur-Yvette, France

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